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Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics

Volumn 30, Issue 3, 2012, Pages

Fabrication and characterization of thin film ZnO Schottky contacts based UV photodetectors: A comparative study

(2) Ali, Ghusoon M a Chakrabarti, Parthasarathi b,c

a MUSTANSIRIYAH UNIVERSITY (Iraq)

b BANARAS HINDU UNIVERSITY (India)

c MOTILAL NEHRU NATIONAL INSTITUTE OF TECHNOLOGY (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; METALLIC FILMS; PALLADIUM; PHOTODETECTORS; PHOTONS; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SOL-GELS; THERMAL EVAPORATION; VACUUM EVAPORATION; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE;

ABSORBANCE SPECTRUM; COMPARATIVE STUDIES; FABRICATION AND CHARACTERIZATIONS; SURFACE CHEMICALS; ULTRAVIOLET WAVELENGTH; UV PHOTODETECTORS; VACUUM DEPOSITION TECHNIQUES; VACUUM THERMAL EVAPORATION;

THIN FILMS;

EID: 85008499438 PISSN: 21662746 EISSN: 21662754 Source Type: Journal
DOI: 10.1116/1.3701945 Document Type: Article

Times cited : (39)

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