A new efficient memory testing algorithm

Automatic Control and Computer Sciences

Volumn 30, Issue 1, 1996, Pages 44-50

  Yarmolik, V N ^a   Mikityuk, V G ^a  

^a BELARUSIAN STATE UNIVERSITY OF INFORMATICS AND RADIOELECTRONICS   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030516730     PISSN: 01464116     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

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2. R. Nair, "Comments on an optimal algorithm for testing stuck-at faults in random access memories", IEEE Trans. Computers, vol. C-28, no. 3, pp. 258-261, 1979.
3. M. S. Abadir and J. K. Reghbati, "Functional testing of semiconductor random access memories", ACM Computing Surveys, vol. 15, no. 3, pp. 175-198, 1983.
4. D. S. Suk and S. M. Reddy, "A March test for functional faults in semiconductor random-access memories", IEEE Trans. Computers, vol. C-30, no. 12, pp. 982-985, 1981.
5. M. Marinescu, "Simple and efficient algorithms for functional RAM testing", Proc. IEEE Int. Test. Conf., IEEE Computer Society Press, pp. 236-239, 1982.
6. A. J. Van de Goor, "An overview of deterministic functional RAM chip testing", ACM Computing Surveys, vol. 22, no. 1, pp. 5-33, 1990.
7. A. J. Van de Goor, Testing Semiconductor Memories, Theory and Practice, John Willey and Sons, Chichester, UK, part 4, pp. 93-124, 1991.
8. S. M. Thatle and A braham, "Testing semiconductor random access memories", Proc. Fault-Tolerant Computer Symp., IEEE Computer Society Press, Los Alamitos, Calif., pp. 81-87, June 1977.
9. A. J. Van de Goor, Testing Semiconductor Memories, Theory and Practice, John Willey and Sons, Chichester, UK, parti, pp. 25-63, 1991.
10. C. A. Papachristou and N. B. Saghal, "An improved method for detection of functional faults in random access memories", IEEE Trans. Computers, vol. C-34, no. 2, pp. 110-116, 1985.