EMC characterization for switching noise investigation on power transistors

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2008-January, Issue , 2008, Pages

  Batista, Emmanuel ^a   Dienot, Jean Marc ^b  

^a ALSTOM   (France)

^b University Institute of Technology   (France)

Author keywords

Computer modelling; EMC couplings; Emission; Power transistors (IGBT); Switching noise

Indexed keywords

COUPLINGS; ELECTROMAGNETIC COMPATIBILITY; EMBEDDED SYSTEMS; FREQUENCY CONVERTER CIRCUITS; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); MIXER CIRCUITS; NEUTRON EMISSION; POWER TRANSISTORS; PULSE WIDTH MODULATION; SWITCHING; VOLTAGE CONTROL;

COMPUTER MODELLING; GENERAL METHODOLOGIES; MIXING POWER; MODEL APPROACH; MULTI DOMAINS; PRINTED CIRCUIT BOARDS (PCB); SWITCHING NOISE;

PRINTED CIRCUIT BOARDS;

EID: 84994133095     PISSN: 10774076     EISSN: 21581118     Source Type: Conference Proceeding    
DOI: 10.1109/ISEMC.2008.4652057     Document Type: Conference Paper

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