Measurement of integrated circuit conducted emissions by using a transverse electromagnetic mode (TEM) cell

IEEE Transactions on Electromagnetic Compatibility

Volumn 43, Issue 4, 2001, Pages 622-628

  Fiori, Franco ^a,b   Musolino, Francesco ^a,b  

^a IEEE   (Italy)

^b POLITECNICO DI TORINO   (Italy)

Author keywords

Conducted emission measurement; Electromagnetic compatibility (EMC); Electromagnetic emission (EME); Integrated circuit (IC); TEM cell; Transmission line

Indexed keywords

TRANSVERSE ELECTROMAGNETIC MODE (TEM) CELLS;

ELECTRIC LINES; ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC FIELD EFFECTS; MAGNETOELECTRIC EFFECTS; PRINTED CIRCUIT BOARDS;

INTEGRATED CIRCUIT LAYOUT;

EID: 0035519099     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/15.974643     Document Type: Article

References (15)

1. Investigation of the theoretical basis for using a 1GHz TEM cell to evaluate the radiated emissions from integrated circuits
2. On-chip measures to achieve EMC
3. RF current evaluation of ICs by MP-10L
4. EMC workbench: Testing methodology, module level testing and standardization
5. Application independent evaluation of electromagnetic emissions for integrated circuits by the measurement of conducted signals
6. Emission of a line in free space and in a TEM cell
7. Bandwidth limitations of TEM cells due to resonances
8. Frequency range of large-scale TEM mode rectangular strip lines
9. A method for calculating electric and magnetic fields in TEM cell at ELF