Electrostatic Swelling Transitions in Surface-Bound Microgels

ACS Applied Materials and Interfaces

Volumn 8, Issue 40, 2016, Pages 27129-27139

  Nyström, Lina ^a   Álvarez Asencio, Rubén ^b,c   Frenning, Göran ^a   Saunders, Brian R ^d   Rutland, Mark W ^b,e   Malmsten, Martin ^a  

^a UPPSALA UNIVERSITY   (Sweden)

^b ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^c INSTITUTO MADRILEÑO DE ESTUDIOS AVANZADOS EN NANOCIENCIA IMDEA NANOCIENCIA   (Spain)

^d UNIVERSITY OF MANCHESTER   (United Kingdom)

^e SP TECHNICAL RESEARCH INSTITUTE OF SWEDEN   (Sweden)

Author keywords

atomic force microscopy; finite element method; microgel; pH responsive; quartz crystal microbalance; surface bound

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFORMATION; ELECTROSTATICS; FINITE ELEMENT METHOD; QUARTZ CRYSTAL MICROBALANCES;

INTERACTION POINTS; MICROGEL; MICROGEL SWELLINGS; NANOMECHANICAL PROPERTY; PH-RESPONSIVE; PH-RESPONSIVE SURFACES; SURFACE BOUNDS; SWELLING TRANSITIONS;

GELS;

EID: 84991627600     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/acsami.6b09751     Document Type: Article

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