Spatial analysis of ZnO thin films prepared by vertically aligned MOCVD

2014 11th Annual High Capacity Optical Networks and Emerging/Enabling Technologies (Photonics for Energy), HONET-PfE 2014

Volumn , Issue , 2014, Pages 67-70

  Mishra, Prakash ^a   Patel, Rahi ^a   Hussain, Babar ^a   Stansell, Justin ^a   Kucukgok, Bahadir ^a   Raja, M Yasin ^a   Lu, Na ^a   Ferguson, Ian T ^a  

^a University of North Carolina at Charlotte   (United States)

Author keywords

MOCVD; photoluminescence; spatial analysis; spectral reflectance; thin film; transmission; zinc oxide

Indexed keywords

DEPOSITION; METALLIC FILMS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; ORGANOMETALLICS; OXIDE FILMS; PHOTOLUMINESCENCE; REFLECTION; THIN FILMS; TRANSMISSIONS; VAPOR DEPOSITION; ZINC; ZINC OXIDE;

NON-CENTROSYMMETRIC; OPTICAL CHARACTERISTICS; SPATIAL ANALYSIS; SPATIAL CONSISTENCY; SPECTRAL REFLECTANCES; TRANSMITTANCE MEASUREMENTS; VARYING TEMPERATURE; ZINC OXIDE THIN FILMS;

SPATIAL VARIABLES MEASUREMENT;

EID: 84988299792     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HONET.2014.7029363     Document Type: Conference Paper

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