Material Classification Using Raw Time-of-Flight Measurements

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 2016-December, Issue , 2016, Pages 3503-3511

  Su, Shuochen ^a,c   Heide, Felix ^c,d   Swanson, Robin ^a   Klein, Jonathan ^b   Callenberg, Clara ^b   Hullin, Matthias ^b   Heidrich, Wolfgang ^a,c  

^a KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Saudi Arabia)

^b UNIVERSITY OF BONN   (Germany)

^c UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^d STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; SURFACE SCATTERING;

FEATURE REPRESENTATION; INCIDENT ILLUMINATION; MATERIAL CLASSIFICATION; REFERENCE SIGNALS; REFLECTANCE-BASED APPROACH; SUBSURFACE SCATTERING; TEMPORAL RESPONSE; TIME OF FLIGHT MEASUREMENTS;

PATTERN RECOGNITION;

EID: 84986325552     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2016.381     Document Type: Conference Paper

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