Reflectance hashing for material recognition

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 07-12-June-2015, Issue , 2015, Pages 3071-3080

  Zhang, Hang ^a   Dana, Kristin ^a   Nishino, Ko ^b  

^a RUTGERS UNIVERSITY   (United States)

^b Drexel University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; PATTERN RECOGNITION;

DICTIONARY LEARNING; HIGH DIMENSIONALITY; MATERIAL RECOGNITION; MATERIAL SURFACE; OPTICAL CAMERA; REAL-WORLD; VIEWING ANGLE;

REFLECTION;

EID: 84959254716     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2015.7298926     Document Type: Conference Paper

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