A statistical approach to material classification using image patch exemplars

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 31, Issue 11, 2009, Pages 2032-2047

  Varma, Manik ^a   Zisserman, Andrew ^b  

^a MICROSOFT RESEARCH   (United States)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

3D textures; Filter banks; Image patches; Material classification; Textons

Indexed keywords

3D TEXTURES; CLASSIFICATION PERFORMANCE; COLUMBIA; DATA SETS; GLOBAL STRUCTURE; IMAGE PATCHES; INTENSITY VALUES; JOINT DISTRIBUTIONS; MARKOV RANDOM FIELDS; MATERIAL CLASSIFICATION; MICROSOFT; RECENT STATE; SAN FRANCISCO; SINGLE IMAGES; SOURCE IMAGES; STATISTICAL APPROACH; TEXTONS; TRAINING IMAGE;

HIDDEN MARKOV MODELS; MATERIALS; TEXTURES; THREE DIMENSIONAL;

FILTER BANKS;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; IMAGE ENHANCEMENT; IMAGE SUBTRACTION; MATERIALS TESTING; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; STATISTICAL ANALYSIS; STATISTICAL MODEL;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; COMPUTER SIMULATION; DATA INTERPRETATION, STATISTICAL; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MATERIALS TESTING; MODELS, STATISTICAL; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SUBTRACTION TECHNIQUE;

EID: 70349850950     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2008.182     Document Type: Article

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