Deep Metric Learning via Lifted Structured Feature Embedding

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 2016-December, Issue , 2016, Pages 4004-4012

  Song, Hyun Oh ^a   Xiang, Yu ^a   Jegelka, Stefanie ^b   Savarese, Silvio ^a  

^a STANFORD UNIVERSITY   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; NEURAL NETWORKS; SEMANTICS;

CONVOLUTIONAL NEURAL NETWORK; DISTANCE METRICS; FEATURE EMBEDDING; NEURAL NETWORK TRAINING; PAIRWISE DISTANCES; SEMANTIC FEATURES; STRUCTURED PREDICTION; VISUAL RECOGNITION;

PATTERN RECOGNITION;

EID: 84986266755     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2016.434     Document Type: Conference Paper

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