IOTA: Integration optimization, triage and analysis tool for the processing of XFEL diffraction images

Journal of Applied Crystallography

Volumn 49, Issue , 2016, Pages 1057-1064

  Lyubimov, Artem Y ^a   Uervirojnangkoorn, Monarin ^a   Zeldin, Oliver B ^a   Brewster, Aaron S ^b   Murray, Thomas D ^c,d   Sauter, Nicholas K ^b   Berger, James M ^d   Weis, William I ^a   Brunger, Axel T ^a  

^a STANFORD UNIVERSITY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d JOHNS HOPKINS UNIVERSITY SCHOOL OF MEDICINE   (United States)

Author keywords

Computer programs; Diffraction data processing; Indexing and integration; Serial femtosecond crystallography; X ray free electron lasers; XFELs

Indexed keywords

COMPUTER PROGRAM LISTINGS; CRYSTALLOGRAPHY; DATA HANDLING; DIFFRACTION; ELECTRONS; FREE ELECTRON LASERS; INDEXING (MATERIALS WORKING); INDEXING (OF INFORMATION); INFORMATION FILTERING; INTEGRATION; LIGHT SOURCES; X RAY CRYSTALLOGRAPHY; X RAY LASERS; IMAGE ANALYSIS;

DIFFRACTION DATA PROCESSING; PRIORI INFORMATION; RADIATION SENSITIVITY; SERIAL FEMTOSECOND CRYSTALLOGRAPHIES; UNIT-CELL DIMENSIONS; X-RAY FREE ELECTRON LASERS; X-RAY LIGHT SOURCES; XFELS;

DATA INTEGRATION;

EID: 84973338660     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S1600576716006683     Document Type: Article

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