SIED: Software implemented error detection

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn 2003-January, Issue , 2003, Pages 589-596

  Nicolescu, B ^a   Savaria, Y ^a   Velazco, R ^b  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

^b TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ERRORS; FAULT TOLERANCE;

BENCHMARK PROGRAMS; DETECTION CAPABILITY; ERROR-DETECTION TECHNIQUES; FAULT COVERAGES; FAULT INJECTION; FAULT TOLERANCE TECHNIQUES; FLOW SCHEMES; PROGRAM CONTROL;

ERROR DETECTION;

EID: 84964921444     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TSM.2005.1250159     Document Type: Conference Paper

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