Identification of wafer defect clusters using a self-organizing multilayer perceptron

ICONIP 2002 - Proceedings of the 9th International Conference on Neural Information Processing: Computational Intelligence for the E-Age

Volumn 2, Issue , 2002, Pages 839-843

  Huang, Chenn Jung ^a  

^a Department of Computer Science and Information Education   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; INFORMATION SCIENCE; MULTILAYERS; TESTING;

DEFECT CLUSTER; DEFECT IDENTIFICATION; ELECTRICAL TESTING; FINAL ASSEMBLY; FLAWED REGIONS; IT FUNCTIONS; WAFER SCALE;

DIES;

EID: 84964556396     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICONIP.2002.1198177     Document Type: Conference Paper

References (9)

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