Two-dimensional field mapping of microstrip lines with a band pass filter or a photonic bandgap structure by fiber-optic EO spectrum analysis system

International Topical Meeting on Microwave Photonics, MWP 2000

Volumn , Issue , 2000, Pages 210-213

  Ohara, T ^a   Abe, M ^a   Wakana, S ^a   Kishi, M ^a   Tsuchiya, M ^a   Kawasaki, S ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b TOKAI UNIVERSITY   (Japan)

Author keywords

2D mapping; Electrooptic probing; photonic bandgap circuit; RF circuit diagnosis; RF spectrum analysis

Indexed keywords

BANDPASS FILTERS; DESIGN FOR TESTABILITY; ELECTRIC FIELDS; ELECTRIC NETWORK ANALYSIS; ENERGY GAP; FIBER OPTICS; MAPPING; MICROSTRIP LINES; MICROWAVE FILTERS; OPTICAL RESONATORS; PHOTONIC BAND GAP; PHOTONIC BANDGAP FIBERS; PHOTONICS; SPECTRUM ANALYSIS; SPEED CONTROL; SPONTANEOUS EMISSION;

2D MAPPING; DEVICES UNDER TESTS; ELECTRIC FIELD MAPPING; ELECTRO-OPTIC PROBING; PHOTONIC BAND-GAP STRUCTURES; RF-CIRCUITS; TWO DIMENSIONAL FIELD;

MICROSTRIP FILTERS;

EID: 84964502646     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWP.2000.889825     Document Type: Conference Paper

References (20)

1. J. A. Valdmanis, and G. Mourou, "Subpicosecond Electrooptic Sampling: Principles and Applications," IEEE J. Quantum Electron., vol. QE-22, pp. 69-78, Jan. 1986.
2. B. H. Kolner, D. M. Bloom, 'Electrooptic Sampling in GaAs Integrated Circuits," IEEE J. Quantum Electron., vol. QE-22, pp. 79-93, Jan. 1986.
3. J. A. Valdmanis, "1THz-Bandwidth Prober for High-Speed Devices and Integrated Circuits," Electron. Lett., vol. 23, pp. 1308-1310, Nov. 1987.
4. T. Nagatsuma, "Electro-Optic Testing Technology for High-Speed LSIs," IEICE Trans. Electron., vol. E79-C, pp. 482-488, Apr. 1996.
5. M. Shinagawa, and T. Nagatsuma, "An Automated Electro-Optic Probing System for Ultra-High-Speed IC's," IEEE Trans. Instrum. Meas., vol. 43, pp. 843-847, Dec. 1994.
6. 3 and GaAs Probes in External E-O Sampling," J. Lightwave Technol., vol. 11, pp. 448-454, March 1993.
7. Y. Imaizumi, M. Shinagawa, and H. Ogawa, "Electric Field Distribution Measurement of Microstrip Antennas and Arrays Using Electro-Optic Sampling," IEEE Trans. Microwave Theory Tech., vol. 43, pp. 2402-2407, Sep. 1995.
8. K. Yang, G. David, J.-G. Yook, I. Papapolymerou, L. P. B. Katehi, and J. F. Whitaker, "Electrooptic Mapping and Finite-Element Modeling of the Near-Field Pattern of a Microstrip Patch Antenna," IEEE Trans. Microwave Theory Tech., vol. 48, pp. 288-294, Feb. 2000.
9. W. Mertin, "Two-dimensional field mapping of monolithic microwave integrated circuits using electrooptic sampling techniques," Optical and Quantum Electronics, vol. 28, pp. 801-817, 1996.
10. T. Pfeifer, T. Löffler, H. G. Roskos, H. Kurz, M. Singer, and E. M. Biebl, "Electro-Optic Near-Field Mapping of Planar Resonators," IEEE Trans. Antennas Prop., vol. 46, pp. 284-291, Feb. 1998.
11. D. R. Hjelme, M. J. Yadlowsky, and A. R. Mickelson, "Two-Dimensional Mapping of the Microwave Potential on MMIC's Using Electrooptic Sampling," IEEE Trans. Microwave Theory Tech., vol. 41, pp. 1149-1158, June/July 1993.
12. W. K. Kuo, S. L. Huang, T. S. Horng, L. C. Chang, "Two-dimensional mapping of electric-field vector by electro-optic prober," Optics Communications, pp. 55-60, April 1998.
13. D. Le Quang, D. Erasme, and B. Huyart, "MMIC-Calibrated Probing by CW Electrooptic Modulation," IEEE Trans. Microwave Theory Tech., vol. 43, pp. 1031-1036, May 1995.
14. S. Wakana, T. Ohara, M. Abe, E. Yamazaki, M. Kishi, and M. Tsuchiya, "Novel Electromagnetic Field Probe using Electro/Magneto-Optical Crystal mounted on an Optical-fiber Facet for Microwave Circuit Diagnosis," for presentation in International Microwave Symposium (IMS) 2000.
15. T. Ohara, M Abe, S. Wakana, M. Kishi, M. Tsuchiya and S. Kawasaki, in preparation.
16. E. Yablonovitch, "Photonic band-gap structures," J. Opt. Soc. Am. B, vol. 10, no. 2, pp. 283-295, Feb. 1993.
17. V. Radisic, Y. Qian, R. Coccioli, and T. Itoh, "Novel 2-D Photonic Band Structure for Microstrip Lines," IEEE Microwave and Guided Wave Lett., vol. 8, no. 2, pp. 69-71, Feb. 1998.
18. D. Le Quang, D. Erasme, and B. Huyart, "Fabry-Perot Enhanced Real-Time Electro-Optic Probing of MMICs," Electron. Lett., vol. 29, pp. 498-499, Mar. 1993.
19. A. J. Vickers, R. Tesser, R. Dudley, M. A. Hassan, "Fabry-Pérot Enhancement of External Electrooptic Sampling," Optical and Quantum Electronics, vol. 29, pp. 661-669, 1997.
20. P. O. Müller, S. B. Alleston, A. J. Vickers, and D. Erasme, "An External Electrooptic Sampling Technique Based on the Fabry-Perot Effect," IEEE J. Quantum Electron., vol. 35, pp. 7-11, Jan. 1999.