Two-dimensional field mapping of monolithic microwave integrated circuits using electrooptic sampling techniques

Optical and Quantum Electronics

Volumn 28, Issue 7, 1996, Pages 801-817

  Mertin, W ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELDS; ELECTROMAGNETIC WAVE PROPAGATION; ELECTROOPTICAL EFFECTS; MATHEMATICAL TECHNIQUES; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; PERFORMANCE;

ELECTROOPTIC SAMPLING TECHNIQUES; MICROWAVE FIELD DISTRIBUTION; TWO DIMENSIONAL FIELD MAPPING;

INTEGRATED CIRCUIT TESTING;

EID: 0030188879     PISSN: 03068919     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00820150     Document Type: Article

References (49)

1. H. WANG, R. LAI, D. C. W. LO, D. C. STEIT, P. H. LIU, R. M. DIA, M. W. POSPIESZALSKI and J. BERENZ, IEEE Microwave & Guided Wave Lett. 5(1995) 150.
2. S. E. ROSENBAUM, B. K. KORMANYOS, L. M. JELLOIAN, M. MATLOUBIAN, A. S. BROWN, L. E. LARSON, L. D. NGUYEN, M. A. THOMPSON, L. P. B. KATHI and G. M. REBEIZ, IEEE Trans. Microwave Theory Tech. 4 (1995) 927.
3. J.-F. LUY, K. M. STROHM, H.-E. SASSE, A. SCHÜPPEN, J. BUECHELER, M.WOLLITZER, A. GRUHLE, F. SCHÄFFLER, U. GUETTRICH and A. KLAASSEN, IEEE Trans. Microwave Theory Tech. 4 (1995) 705.
4. M. MEYER, Compound Semiconductor 1(2) (1995) 21.
5. J. GOEL, IEEE MTT-S Newsletter Spring (1992) 5.
6. H. DÄMBKES and M. BERROTH, Microelectron. Eng. in press.
7. H. SCHUMACHER and E. W. STRID, in Semiconductors and Semimetals, Vol. 28, edited by R. B. Marcus (Academic Press, London, 1990) pp. 41-83.
8. J. T. L. THONG (ed.), Electron Beam Testing Technology (Plenum Press, 1993).
9. J. F. WHITAKER, J. A. VALDMANIS, M. Y. FRANKEL, S. GUPTA, J. M. CHWALEK and G. A. MOUROU, Micoelectron. Eng. 12 (1990) 369.
10. K. J. WEINGARTEN, M. J. W. RODWELL and D. M. BLOOM, IEEE J. Quantum Electron. 2 (1988) 198.
11. B. A. NECHAY, F. HO, A. S. HOU and D. M. BLOOM, J. Vac. Sci. Technol. B 13(3) (1995) 1369.
12. A. LEYK, C. BÖHM, D. W. VAN DER WEIDE and E. KUBALEK, Electron. Lett. 13 (1995) 1046.
13. W. MERTIN, K. D. HERRMANN and E. KUBALEK, Microelectron. Eng. 12 (1990) 287.
14. J. FEHR and E. KUBALEK, in Proceedings of the 22nd European Microwave Conference (Microwave Exhibitions and Publishers, Kent, 1992) p. 163.
15. A. YARIV and P. YEH, Optical Waves in Crystals. Propagation and Control of Laser Radiation (Wiley, New York, 1984) pp. 220-316.
16. K. E. MEYER and G. A. MOUROU, in Picosecond Electronics and Optoelectronics, edited by G. A. Mourou, D. M. Bloom and C. H. Lee (Springer-Verlag, New York, 1985) p. 46.
17. K. E. MEYER and G. A. MOUROU, Electron. Lett. 13 (1985) 568.
18. Y. H. LO, M. C. WU, Z. H. ZHU, S. Y. WANH and S. WANG, Appl. Phys. Lett. 25 (1987) 1791.
19. D. G. STEARNS, J. Appl. Phys. 3 (1989) 1308.
20. W. R. DONALDSON, L. KINGSLEY, M. WEINER, A. KIM and R. ZETO, J. Appl. Phys. 12 (1990) 6453.
21. L. E. KINGSLEY and W. R. DONALDSON, IEEE Trans, on Electron Devices 12 (1990) 2449.
22. W. R. DONALDSON, in Proceedings of the Eighth IEEE Pulsed Power Conference, edited by R. White and K. Prestarck (IEEE, New York, 1991) p. 45.
23. M. G. LI, E. A. CHAUCHARD, C. H. LEE and H.-L. A. HUNG, in OSA Proceedings on Picosecond Electronics and Optoelectronics, edited by T. C. L. G. Sollner and J. Shah, Vol. 9 (1991) p. 54.
24. H.-L. A. HUNG, M. G. LI and C. H. LEE, in Optical Technology for Microwave Applications V, SPIE Vol. 1476 (1991) p. 276.
25. W. MERTIN, C. BÖHM, L. J. BALK and E. KUBALEK, IEEE MTT-S Digest (1992) p. 1443.
26. V. RADISIC, D. R. HJELME, Z. B. POPOVIC and A. R. MICKELSON, IEEE MTT-S Digest (1993) p. 51.
27. K. Y. CHEN, P. BIERNACKI, A. R. MICKELSON and Z. B. POPOVIC, IEEE MTT-S Digest (1993) p. 313.
28. D. R. HJELME, M. J. YADLOWSKY and A. R. MICKELSON, IEEE Trans. Microwave Theory Tech., 6/7 (1993) 1149.
29. V. RADISIC, D. R. HJELME, A. HORRIGAN, Z. B. POPOVIC and A. R. MICKELSON, IEEE Trans. Microwave Theory Tech. 9 (1993) 1524.
30. G. DAVID, S. REDLICH, W. VON WENDORFF, G. WINGEN, S. ZUMKLEY and D. JÄGER, in Proceedings of MIOP'93 (1993) p. 492.
31. G. DAVID, S. REDLICH, W. MERTIN, R. M. BERTENBURG, S. KOSSLOWSKI, F. J. TEGUDE, E. KUBALEK and D. JÄGER, in Proceedings of European Microwave Conference (1993) p. 497.
32. D. JÄGER, G. DAVID and W. VON WENDORFF, Microelectron. Eng. 24 (1994) 327.
33. G. DAVID, S. REDLICH, W. MERTIN, E. KUBALEK and D. JÄGER, Microelectron. Eng. 24 (1994) 385.
34. R. A. FALK, J. C. ADAMS, C. D. CAPPS, S. G. FERRIER and J. A. KRINSKY, IEEE Trans, on Electron Devices 1 (1995) 43.
35. J. C. ADAMS, R. A. FALK, S. G. FERRIER and C. D. CAPPS, IEEE Trans, on Electron Devices 6 (1995) 1081.
36. W. MERTIN, A. LEYK, G. DAVID, R. M. BERTENBURG, S. KOSSLOWSKI, F. J. TEGUDE, I. WOLFE, D. JÄGER and E. KUBALEK, IEEE MTT-S Digest (1994) p. 1597.
37. G. DAVID, R. TEMPEL, A. ISING, Y. KALAYCI, I. WOLFF and D. JÄGER, in Proceedings of 24th European Microwave Conference (1994) p. 1386.
38. D. JÄGER and G. DAVID, in Proceedings of Microwaves and RF '95 (London, 1995), p. 132.
39. G. DAVID, P. SCHMITZ, S. REDLICH, J. BUSCHKE, R. KREMER and D. JÄGER, in Proceedings of 1994 Asia-Pacific Microwave Conference - APMC'94 (1994) p. 149.
40. G. DAVID, W. SCHROEDER, D. JÄGER and I. WOLFF, IEEE MTT-S Digest (1995) p. 1049.
41. G. DAVID, R. KREMER, S. REDLICH and D. JÄGER, in Proceedings of MIOP'95 (1995) p.293.
42. D. JÄGER and G. DAVID, in Proceedings of International Symposium on Signals, Systems and Electronics ISSSE'95 (1995).
43. T. LÖFFLER, T. PFEIFER, H. G. ROSKOS, H. KURZ and D. W. VAN DER WEIDE, Microelectron. Eng. in press.
44. Y. IMAIZUMI, M. SHINAGAWA and H. OGAWA, IEEE Trans. Micowave Theory Tech. 9 (1995) 2402.
45. R. B. MARCUS (ed.), Semiconductors and Semimetals, Vol. 20, Measurement of High-Speed Signals in Solid State Devices (Academic Press, London, 1990).
46. W. MERTIN, Microelectron. Eng. 31 (1996) 365.
47. B. H. KOLNER, K. J. WEINGARTEN, M. J. W. RODWELL and D. M. BLOOM, in Picosecond Electronics and Optoelectronics, edited by G. A. Mourou, D. M. Bloom and C. H. Lee (Springer-Verlag, 1985) p. 50.
48. S. KOSSLOWSKI, N. H. L. KOSTER, R. M. BERTENBURG, S. HEIMEN and I. WOLFF, in ITG Fachbericht 110 (VDE-Verlag, Berlin, 1989), p. 203.
49. W. MERTIN, A. LEYK, F. TAENZLER, T. NOVAK, G. DAVID, D. JÄGER and E. KUBALEK, Microelectron. Eng. 24 (1994) 377.