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Volumn 48, Issue 2, 2000, Pages 288-294

Electrooptic mapping and finite-element modeling of the near-field pattern of a microstrip patch antenna

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE UNDER TEST; ELECTROOPTIC CRYSTALS; ELECTROOPTIC MAPPING;

EID: 0033872471     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.821779     Document Type: Article
Times cited : (116)

References (14)
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  • 2
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    • A new miniature magnetic field probe for measuring three-dimensional fields in planar high frequency circuits
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    • Gao, Y.1    Wolff, I.2
  • 4
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    • Subpicosecond electrooptic sampling: Principles and applications
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    • J. Valdmanis and G. Mourou, "Subpicosecond electrooptic sampling: Principles and applications," IEEE J. Quantum Electron., vol. QE-22, pp. 69-78, Jan. 1986.
    • (1986) IEEE J. Quantum Electron. , vol.QE-22 , pp. 69-78
    • Valdmanis, J.1    Mourou, G.2
  • 5
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    • (1986) IEEE J. Quantum Electron. , vol.QE-22 , pp. 79-93
    • Kolner, B.H.1    Bloom, D.M.2
  • 6
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    • Two-dimensional field mapping of GaAs microstrip circuit by electrooptic sensing
    • Salt Lake City, UT, Mar.
    • M. G. Li, E. A. Chauchard, C. H. Lee, and H.-L. A. Hung, "Two-dimensional field mapping of GaAs microstrip circuit by electrooptic sensing," in OSA Proc. Picosecond Electron. Optoelectron., Salt Lake City, UT, Mar. 1991, pp. 54-58.
    • (1991) OSA Proc. Picosecond Electron. Optoelectron , pp. 54-58
    • Li, M.G.1    Chauchard, E.A.2    Lee, C.H.3    Hung, H.-L.A.4
  • 7
    • 0041188176 scopus 로고
    • Two-dimensional direct electro-optic field mapping in a monolithic integrated GaAs amplifier
    • Madrid, Spain, Sept.
    • G. David, S. Redlich, W. Mertin, R. M. Bertenburg, S. Koßlowski, F. J. Tegude, and D. Jäger, "Two-dimensional direct electro-optic field mapping in a monolithic integrated GaAs amplifier," in Proc. 23rd EuMC, Madrid, Spain, Sept. 1993, pp. 497-499.
    • (1993) Proc. 23rd EuMC , pp. 497-499
    • David, G.1    Redlich, S.2    Mertin, W.3    Bertenburg, R.M.4    Koßlowski, S.5    Tegude, F.J.6    Jäger, D.7
  • 8
    • 0030191711 scopus 로고    scopus 로고
    • Analysis of microwave propagation effects using 2D electro-optic field mapping techniques
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    • G. David, R. Tempel, I. Wolff, and D. Jäger, "Analysis of microwave propagation effects using 2D electro-optic field mapping techniques," Opt. Quantum Electron., vol. 28, pp. 919-931, July 1996.
    • (1996) Opt. Quantum Electron. , vol.28 , pp. 919-931
    • David, G.1    Tempel, R.2    Wolff, I.3    Jäger, D.4
  • 9
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    • High resolution electro-optic mapping of near-field distributions in integrated microwave circuits
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    • K. Yang, G. David, S. Robertson, J. F. Whitaker, and L. P. B. Katehi, "High resolution electro-optic mapping of near-field distributions in integrated microwave circuits," in IEEE MTT-S Int. Microwave Symp. Dig.. New York, June 1998, pp. 949-962.
    • (1998) IEEE MTT-S Int. Microwave Symp. Dig. , pp. 949-962
    • Yang, K.1    David, G.2    Robertson, S.3    Whitaker, J.F.4    Katehi, L.P.B.5
  • 10
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    • Characterization of a monolithic slot antenna using an electro-optic sampling technique
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    • K. Kamogawa, I. Toyoda, K. Nishikawa, and T. Tokumitsu, "Characterization of a monolithic slot antenna using an electro-optic sampling technique," IEEE Microwave Guided Wave Lett., vol. 4, pp. 414-416, Dec. 1994.
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    • Kamogawa, K.1    Toyoda, I.2    Nishikawa, K.3    Tokumitsu, T.4
  • 13
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    • Electro-optic measurement techniques for picosecond materials, devices, and integrated circuits
    • R. B. Marcus, Ed. New York: Academic
    • J. A. Valdmanis, "Electro-optic measurement techniques for picosecond materials, devices, and integrated circuits," in Measurement of High-Speed Signals in Solid State Devices, R. B. Marcus, Ed. New York: Academic, 1990, pp. 136-219.
    • (1990) Measurement of High-speed Signals in Solid State Devices , pp. 136-219
    • Valdmanis, J.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.