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Volumn 3, Issue , 2000, Pages 1615-1618
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Novel electromagnetic field probe using electro/magneto-optical crystals mounted on optical-fiber facets for microwave circuit diagnosis
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Author keywords
[No Author keywords available]
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Indexed keywords
DEVICE UNDER TEST;
ELECTROMAGNETIC FIELD PROBING SCHEME;
CONTINUOUS WAVE LASERS;
CRYSTALS;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTROMAGNETIC FIELDS;
ELECTROOPTICAL EFFECTS;
MAGNETOOPTICAL EFFECTS;
MICROSTRIP LINES;
PHOTODETECTORS;
PROBES;
SEMICONDUCTOR LASERS;
SINGLE MODE FIBERS;
SPECTRUM ANALYZERS;
MICROWAVE CIRCUITS;
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EID: 0033694440
PISSN: 0149645X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (8)
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References (6)
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