Two-dimensional mapping of electric-field vector by electro-optic prober

Optics Communications

Volumn 149, Issue 1-3, 1998, Pages 55-60

  Kuo, W K ^a   Huang, S L ^b   Horng, T S ^b   Chang, L C ^a  

^a National Science Council   (Taiwan)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; ELECTRIC FIELD MEASUREMENT; ELECTROOPTICAL EFFECTS; LASER BEAMS; LITHIUM COMPOUNDS; SENSITIVITY ANALYSIS; TANTALUM COMPOUNDS; VECTORS;

ELECTRIC FIELD VECTOR MEASUREMENT;

OPTOELECTRONIC DEVICES;

EID: 0032046973     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(97)00703-7     Document Type: Article

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