Recent developments in CrystFEL

Journal of Applied Crystallography

Volumn 49, Issue , 2016, Pages 680-689

  White, Thomas A ^a   Mariani, Valerio ^a   Brehm, Wolfgang ^b   Yefanov, Oleksandr ^a   Barty, Anton ^a   Beyerlein, Kenneth R ^a   Chervinskii, Fedor ^c   Galli, Lorenzo ^a   Gati, Cornelius ^a   Nakane, Takanori ^d   Tolstikova, Alexandra ^a,e   Yamashita, Keitaro ^f   Yoon, Chun Hong ^a,g   Diederichs, Kay ^b   Chapman, Henry N ^a,e  

^a DESY   (Germany)

^b UNIVERSITY OF KONSTANZ   (Germany)

^c MOSCOW INSTITUTE OF PHYSICS AND TECHNOLOGY   (Russian Federation)

^d UNIVERSITY OF TOKYO   (Japan)

^e UNIVERSITY OF HAMBURG   (Germany)

^f RIKEN SPring 8 Center ^*  (Japan)

^g SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

computer programs; data processing; serial crystallography; X ray free electron lasers; XFELs

Indexed keywords

COMPUTER PROGRAM LISTINGS; CRYSTALLOGRAPHY; DATA HANDLING; DATA PROCESSING; ELECTRONS; FREE ELECTRON LASERS;

CRYSTFEL; INTEGRATED DATA; NEW PROGRAMS; SERIAL CRYSTALLOGRAPHY; SOFTWARE SUITE; X-RAY FREE ELECTRON LASERS; X-RAY SOURCES; XFELS;

X RAY CRYSTALLOGRAPHY;

EID: 84963852608     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S1600576716004751     Document Type: Article

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