DeepEdge: A multi-scale bifurcated deep network for top-down contour detection

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 07-12-June-2015, Issue , 2015, Pages 4380-4389

  Bertasius, Gedas ^a   Shi, Jianbo ^a   Torresani, Lorenzo ^b  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b DARTMOUTH COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; CONVOLUTION; FEATURE EXTRACTION; IMAGE SEGMENTATION; OBJECT RECOGNITION; PATTERN RECOGNITION;

CONTOUR DETECTION; FEATURE ENGINEERINGS; FUNDAMENTAL COMPONENT; LARGE-SCALE OBJECTS; LOW-LEVEL FEATURES; OBJECT DETECTION SYSTEMS; STATE OF THE ART; TRADITIONAL APPROACHES;

OBJECT DETECTION;

EID: 84959231756     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2015.7299067     Document Type: Conference Paper

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