Frustration of Negative Capacitance in Al2O3/BaTiO3 Bilayer Structure

Scientific Reports

Volumn 6, Issue , 2016, Pages

  Kim, Yu Jin ^a   Park, Min Hyuk ^a   Lee, Young Hwan ^a   Kim, Han Joon ^a   Jeon, Woojin ^a   Moon, Taehwan ^a   Do Kim, Keum ^a   Jeong, Doo Seok ^b   Yamada, Hiroyuki ^c   Hwang, Cheol Seong ^a  

^a Seoul National University   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

^c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84953924564     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep19039     Document Type: Article

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