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Volumn 75, Issue 18, 2007, Pages

Drift of charged defects in local fields as aging mechanism in ferroelectrics

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EID: 34347331337     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.184107     Document Type: Article
Times cited : (74)

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