-
1
-
-
0033301065
-
Non-standard physicochemical and electrical examinations in thick-film and LTCC technologies
-
Nis (Yugoslavia)
-
nd Int. Microelectronics Conf. MIEL-2000, Nis (Yugoslavia), 2000, p.497-504
-
(2000)
nd Int. Microelectronics Conf. MIEL-2000
, pp. 497-504
-
-
Dziedzic, A.1
-
3
-
-
0002974733
-
Chemical, structural and mechanical properties of the LTCC tapes
-
W. Kinzy Jones, Y. Liu, B: Larsen, P. Wang, M. Zampino: "Chemical, structural and mechanical properties of the LTCC tapes", Proc. 2000 Int. Symp. on Microelectronics (IMAPS-USA), p.669-674
-
Proc. 2000 Int. Symp. on Microelectronics (IMAPS-USA)
, pp. 669-674
-
-
Kinzy Jones, W.1
Liu, Y.2
Larsen, B.3
Wang, P.4
Zampino, M.5
-
4
-
-
0029307832
-
Thick-film resistor/dielectric interactions in a Low Temperature Co-fired Ceramic package
-
R.C. Sutterlin, G.O. Dayton, J.V. Biggers: "Thick-film resistor/dielectric interactions in a Low Temperature Co-fired Ceramic package", IEEE Trans. on Comp., Pack., and Manuf. Technol. -Part B, vol. 18 (1995), p.346-351
-
(1995)
IEEE Trans. on Comp., Pack., and Manuf. Technol. -Part B
, vol.18
, pp. 346-351
-
-
Sutterlin, R.C.1
Dayton, G.O.2
Biggers, J.V.3
-
5
-
-
0002042526
-
Characterization and performance prediction for integral resistors in Low Temperature Co-Fired Ceramic technology
-
K. Delaney, J. Barrett, J. Barton, R. Doyle: "Characterization and performance prediction for integral resistors in Low Temperature Co-Fired Ceramic technology", IEEE Trans. on Adv. Packaging, vol.22 (1999), p.78-85
-
(1999)
IEEE Trans. on Adv. Packaging
, vol.22
, pp. 78-85
-
-
Delaney, K.1
Barrett, J.2
Barton, J.3
Doyle, R.4
-
6
-
-
0033328064
-
Electrical and structural characterization of thick film resistors at various LTCC systems
-
A. Dziedzic, L.J. Golonka, M. Henke, J. Kita, H. Thust, K.-H. Drue, R. Bauer, L. Rebenklau, K.-J. Wolter: "Electrical and structural characterization of thick film resistors at various LTCC systems", Proc. 1999 Int. Symp. on Microelectronics (IMAPS-USA), p.510-515
-
Proc. 1999 Int. Symp. on Microelectronics (IMAPS-USA)
, pp. 510-515
-
-
Dziedzic, A.1
Golonka, L.J.2
Henke, M.3
Kita, J.4
Thust, H.5
Drue, K.-H.6
Bauer, R.7
Rebenklau, L.8
Wolter, K.-J.9
-
7
-
-
0034316512
-
Microstructure and phase development of buried resistors in Low Temperature Co-fired Ceramic
-
M.A. Rodriguez, P.Yang, P. Kotula, D. Dimos: "Microstructure and phase development of buried resistors in Low Temperature Co-fired Ceramic, Journal of Electroceramics, vol.5 (2000), p.217-223
-
(2000)
Journal of Electroceramics
, vol.5
, pp. 217-223
-
-
Rodriguez, M.A.1
Yang, P.2
Kotula, P.3
Dimos, D.4
-
8
-
-
0035339867
-
Electrical and stability properties and ultrasonic microscope characterisation of low temperature co-fied ceramics resistors
-
A. Dziedzic, L.J. Golonka, J. Kita, H. Thust, K-H. Drue, R. Bauer, L. Rebenklau, K.-J. Wolter: "Electrical and stability properties and ultrasonic microscope characterisation of low temperature co-fied ceramics resistors", Microelectronics Reliability,vol.41 (2001), p.669-676
-
(2001)
Microelectronics Reliability
, vol.41
, pp. 669-676
-
-
Dziedzic, A.1
Golonka, L.J.2
Kita, J.3
Thust, H.4
Drue, K.-H.5
Bauer, R.6
Rebenklau, L.7
Wolter, K.-J.8
-
10
-
-
0032494044
-
1/f noise in polymer thick-film resistors
-
A. Dziedzic, A. Kolek: "1/f noise in polymer thick-film resistors", J. Phys. D: Appl. Phys., vol.31 (1998), p.2091-2097
-
(1998)
J. Phys. D: Appl. Phys.
, vol.31
, pp. 2091-2097
-
-
Dziedzic, A.1
Kolek, A.2
-
13
-
-
0034325329
-
Current crowding and its effect on 1/f noise and third harmonic distortion - A case study for quality assessment of resistors
-
E.P. Vandamme, L.K.J. Vandamme: "Current crowding and its effect on 1/f noise and third harmonic distortion - a case study for quality assessment of resistors", Microelectronics Reliability, vol.40 (2000), p.1847-53
-
(2000)
Microelectronics Reliability
, vol.40
, pp. 1847-1853
-
-
Vandamme, E.P.1
Vandamme, L.K.J.2
-
15
-
-
0032058148
-
Voltage nonlinearity of carbon black/polyesterimide thick resistive films
-
A. Dziedzic, J. Kita, P. Mach: "Voltage nonlinearity of carbon black/polyesterimide thick resistive films", Vacuum, vol.50 (1998), p.125-130
-
(1998)
Vacuum
, vol.50
, pp. 125-130
-
-
Dziedzic, A.1
Kita, J.2
Mach, P.3
-
16
-
-
84952928544
-
Nonlinearity between interconnection and resistive layer
-
G. Harman and P. Mach (eds.) Kluwer Acad. Publishers
-
P. Mach: "Nonlinearity between interconnection and resistive layer", in G. Harman and P. Mach (eds.) "Microelectronic Interconnections and Assembly", Kluwer Acad. Publishers 1998, p.225-231
-
(1998)
Microelectronic Interconnections and Assembly
, pp. 225-231
-
-
Mach, P.1
-
18
-
-
0343877208
-
Microstructural, XRD and electrical characterization of some thick film resistors
-
M. Hrovat, Z. Samardzija, J. Holc, D. Belavic: "Microstructural, XRD and electrical characterization of some thick film resistors", J. Mater.Sci.: Mater. in Electronics, vol.11 (2000), p.199-208
-
(2000)
J. Mater.Sci.: Mater. in Electronics
, vol.11
, pp. 199-208
-
-
Hrovat, M.1
Samardzija, Z.2
Holc, J.3
Belavic, D.4
|