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Volumn 2001-January, Issue , 2001, Pages 137-141

DC and AC electrical properties and long-term stability of LTCC resistors

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; CERAMIC PRODUCTS; CONCURRENT ENGINEERING; ELECTRONICS PACKAGING; STABILITY; TEMPERATURE; TEMPERATURE DISTRIBUTION;

EID: 84952882121     PISSN: 21612528     EISSN: 21612536     Source Type: Conference Proceeding    
DOI: 10.1109/ISSE.2001.931032     Document Type: Conference Paper
Times cited : (2)

References (18)
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    • Nis (Yugoslavia)
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  • 5
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    • Characterization and performance prediction for integral resistors in Low Temperature Co-Fired Ceramic technology
    • K. Delaney, J. Barrett, J. Barton, R. Doyle: "Characterization and performance prediction for integral resistors in Low Temperature Co-Fired Ceramic technology", IEEE Trans. on Adv. Packaging, vol.22 (1999), p.78-85
    • (1999) IEEE Trans. on Adv. Packaging , vol.22 , pp. 78-85
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  • 7
    • 0034316512 scopus 로고    scopus 로고
    • Microstructure and phase development of buried resistors in Low Temperature Co-fired Ceramic
    • M.A. Rodriguez, P.Yang, P. Kotula, D. Dimos: "Microstructure and phase development of buried resistors in Low Temperature Co-fired Ceramic, Journal of Electroceramics, vol.5 (2000), p.217-223
    • (2000) Journal of Electroceramics , vol.5 , pp. 217-223
    • Rodriguez, M.A.1    Yang, P.2    Kotula, P.3    Dimos, D.4
  • 10
    • 0032494044 scopus 로고    scopus 로고
    • 1/f noise in polymer thick-film resistors
    • A. Dziedzic, A. Kolek: "1/f noise in polymer thick-film resistors", J. Phys. D: Appl. Phys., vol.31 (1998), p.2091-2097
    • (1998) J. Phys. D: Appl. Phys. , vol.31 , pp. 2091-2097
    • Dziedzic, A.1    Kolek, A.2
  • 13
    • 0034325329 scopus 로고    scopus 로고
    • Current crowding and its effect on 1/f noise and third harmonic distortion - A case study for quality assessment of resistors
    • E.P. Vandamme, L.K.J. Vandamme: "Current crowding and its effect on 1/f noise and third harmonic distortion - a case study for quality assessment of resistors", Microelectronics Reliability, vol.40 (2000), p.1847-53
    • (2000) Microelectronics Reliability , vol.40 , pp. 1847-1853
    • Vandamme, E.P.1    Vandamme, L.K.J.2
  • 15
    • 0032058148 scopus 로고    scopus 로고
    • Voltage nonlinearity of carbon black/polyesterimide thick resistive films
    • A. Dziedzic, J. Kita, P. Mach: "Voltage nonlinearity of carbon black/polyesterimide thick resistive films", Vacuum, vol.50 (1998), p.125-130
    • (1998) Vacuum , vol.50 , pp. 125-130
    • Dziedzic, A.1    Kita, J.2    Mach, P.3
  • 16
    • 84952928544 scopus 로고    scopus 로고
    • Nonlinearity between interconnection and resistive layer
    • G. Harman and P. Mach (eds.) Kluwer Acad. Publishers
    • P. Mach: "Nonlinearity between interconnection and resistive layer", in G. Harman and P. Mach (eds.) "Microelectronic Interconnections and Assembly", Kluwer Acad. Publishers 1998, p.225-231
    • (1998) Microelectronic Interconnections and Assembly , pp. 225-231
    • Mach, P.1
  • 18
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    • Microstructural, XRD and electrical characterization of some thick film resistors
    • M. Hrovat, Z. Samardzija, J. Holc, D. Belavic: "Microstructural, XRD and electrical characterization of some thick film resistors", J. Mater.Sci.: Mater. in Electronics, vol.11 (2000), p.199-208
    • (2000) J. Mater.Sci.: Mater. in Electronics , vol.11 , pp. 199-208
    • Hrovat, M.1    Samardzija, Z.2    Holc, J.3    Belavic, D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.