Characterization and performance prediction for integral resistors in low temperature co-fired ceramic technology

IEEE Transactions on Advanced Packaging

Volumn 22, Issue 1, 1999, Pages 78-85

  Delaney, Kieran ^a   Barrett, John ^a   Barton, John ^a   Doyle, Rory ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

Electrical characterization; Integral resistors; Low temperature co fired technology (ltcc); Multichip module (mcm); Predictive functions

Indexed keywords

EID: 0002042526     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/6040.746546     Document Type: Article

References (12)

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3. K. DelaneyJ. Barrett, J. Barton, and R. Doyle "Characterization of the electrical performance of buried capacitors and resistors in low temperature co-fired (LTCC) ceramic," presented at 48th ECTC, Seattle, WA, May 1998
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