Electrical and structural characterization of thick film resistors at various LTCC systems

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3906, Issue , 1999, Pages 510-515

  Dziedzic, A ^a   Golonka, L J ^a   Henke, M ^a   Kita, J ^a   Thust, H ^a   Drue, K H ^a   Bauer, R ^a   Rebenklau, L ^a   Wolter, K J ^a  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE MEASUREMENT; ELECTRON DEVICE MANUFACTURE; MICROSTRUCTURE; PERFORMANCE; STABILITY; TEMPERATURE; THICK FILMS; THRESHOLD VOLTAGE;

LOW TEMPERATURE COFIRING CERAMICS; SHEET RESISTANCE; THICK FILM RESISTORS;

RESISTORS;

EID: 0033328064     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)