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Volumn 2000-January, Issue , 2000, Pages 137-143

Dynamic timing analysis considering power supply noise effects

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYSIS;

EID: 84950154686     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2000.838866     Document Type: Conference Paper
Times cited : (9)

References (11)
  • 1
    • 0032657615 scopus 로고    scopus 로고
    • Analysis of performance impact caused by power supply noise in deep submicron devices
    • June
    • Y.-M. Jiang and K.-T. Cheng. Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices. Proceedings of Design Automation Conference, pages 760-765, June 1999.
    • (1999) Proceedings of Design Automation Conference , pp. 760-765
    • Jiang, Y.-M.1    Cheng, K.-T.2
  • 7
    • 0030704451 scopus 로고    scopus 로고
    • Power supply noise analysis methodology for deep submicron VLSI chip design
    • June
    • H. H. Chen and D. D. Ling. Power Supply Noise Analysis Methodology for Deep Submicron VLSI Chip Design. Proceedings of Design Automation Conference, pages 638-643, June 1997.
    • (1997) Proceedings of Design Automation Conference , pp. 638-643
    • Chen, H.H.1    Ling, D.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.