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MRS Bulletin

Volumn 40, Issue 11, 2015, Pages 933-942

Composite epitaxial thin films: A new platform for tuning, probing, and exploiting mesoscale oxides

(3) MacManus Driscoll, J L a Suwardi, A a Wang, H b

a UNIVERSITY OF CAMBRIDGE (United Kingdom)

b Department of Electrical and Computer Engineering (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATERIALS PROPERTIES; OXIDE FILMS; STRUCTURAL PROPERTIES; THIN FILMS;

ELECTRONIC DEVICE; EPITAXIAL STABILIZATION; EPITAXIAL THIN FILMS; HIGH CRYSTALLINITY; MESO-SCALE SYSTEMS; MESOSCOPIC STRUCTURE; STRUCTURAL UNIFORMITY; SURFACE DEGRADATION;

COMPOSITE FILMS;

EID: 84949215203 PISSN: 08837694 EISSN: None Source Type: Journal
DOI: 10.1557/mrs.2015.258 Document Type: Review

Times cited : (54)

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