Highly aligned epitaxial nanorods with a checkerboard pattern in oxide films

Nano Letters

Volumn 8, Issue 2, 2008, Pages 720-724

  Park, S ^a,b   Horibe, Y ^a,b   Asada, T ^a,b,c   Wielunski, L S ^b   Lee, N ^a,b   Bonanno, P L ^d   O'Malley, S M ^d   Sirenko, A A ^d   Kazimirov, A ^e   Tanimura, M ^c   Gustafsson, T ^b   Cheong, S W ^a,b  

^a RUTGERS UNIVERSITY   (United States)

^b RUTGERS UNIVERSITY   (United States)

^c NISSAN ARC LTD   (Japan)

^d NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^e Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHECKERBOARD PATTERN; NANOCHECKERBOARDS; SOLID-STATE METHODS;

EPITAXIAL FILMS; FILM GROWTH; MAGNESIA; OXIDE FILMS; PHASE SEPARATION; SELF ASSEMBLY; SOLID STATE REACTIONS;

NANORODS;

NANOTUBE; OXIDE;

ANISOTROPY; ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

ANISOTROPY; CRYSTALLIZATION; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; MOLECULAR CONFORMATION; NANOTECHNOLOGY; NANOTUBES; OXIDES; PARTICLE SIZE; SURFACE PROPERTIES;

EID: 40449107943     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl072848s     Document Type: Article

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