Test methods, test techniques and failure criteria for evaluation of ESD degradation of analog and radio frequency (RF) technology

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn 2002-January, Issue , 2002, Pages 92-100

  Voldman, Steven H ^a   Ronan, Brian ^b   Ames, Steven ^c   Van Laecke, Amy ^a   Rascoe, Jay ^a   Lanzerotti, Louis ^a   Sheridan, David ^a  

^a IBM RESEARCH   (United States)

^b PRINCETON UNIVERSITY   (United States)

^c IBM   (United States)

Author keywords

Degradation; Electrostatic discharge; Radio frequency; Testing

Indexed keywords

DEGRADATION; ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; RADIO WAVES; TESTING;

FAILURE CRITERIA; FUNCTIONAL PRODUCTS; RADIO FREQUENCIES; REFLECTION METHODS; RF PERFORMANCE; TEST METHOD; TEST TECHNIQUES; TIME DOMAIN REFLECTIONS;

TIME DOMAIN ANALYSIS;

EID: 84948743535     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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