Interface feature characterization and Schottky interfacial layer confirmation of TiO 2 nanotube array film

Applied Surface Science

Volumn 355, Issue , 2015, Pages 849-860

  Li, Hongchao ^a,b   Tang, Ningxin ^a   Yang, Hongzhi ^a   Leng, Xian ^a   Zou, Jianpeng ^a  

^a CENTRAL SOUTH UNIVERSITY   (China)

^b Chongyi Zhangyuan Tungsten Industry Corporation Limited   (China)

Author keywords

Characterization; Interface features; Schottky interface layer; TiO 2 nanotube array film

Indexed keywords

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; ELECTRON DIFFRACTION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOTUBES; OXIDE MINERALS; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TITANIUM DIOXIDE; X RAY DIFFRACTION; YARN;

ANNEALING TEMPERATURES; FEATURE CHARACTERIZATION; INTERFACE LAYER; INTERFACIAL MICROSTRUCTURE; MICROPORE FORMATION; SELECTED AREA ELECTRON DIFFRACTION; TIO2 NANOTUBE ARRAYS; TITANIUM DIOXIDES (TIO2);

INTERFACES (MATERIALS);

EID: 84944322734     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2015.07.088     Document Type: Article

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