Interfacial Structures of Polyurethane Thin Films on Various Substrate Materials

Polymer Journal

Volumn 35, Issue 12, 2003, Pages 929-937

  Kim, Jangsoon ^a,c   Cho, Jaedong ^a   Ryba, Earle ^a   Bai, Jianming ^b  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c LG Chemical Ltd   (South Korea)

Author keywords

Grazing Incidence X ray Diffraction; Polyurethane Thin Film; Substrate Induced Ordering

Indexed keywords

GRAZING INCIDENCE X-RAY DIFFRACTION (GIXD); TEMPERATURE GRADIENTS;

CRYSTAL LATTICES; CRYSTALLIZATION; ENTROPY; MOLECULAR ORIENTATION; PLASTIC FILMS; SHEAR STRESS; SUBSTRATES; SURFACE TOPOGRAPHY; THERMAL EXPANSION; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

POLYURETHANES;

EID: 1042269752     PISSN: 00323896     EISSN: None     Source Type: Journal    
DOI: 10.1295/polymj.35.929     Document Type: Article

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