Aberration-corrected electron microscopy of nanoparticles

Advanced Transmission Electron Microscopy: Applications to Nanomaterials

Volumn , Issue , 2015, Pages 1-30

  Yacamán, Miguel José ^a   Santiago, Ulises ^a   Mejía Rosales, Sergio ^b  

^a UNIVERSITY OF TEXAS AT SAN ANTONIO   (United States)

^b UNIVERSIDAD AUTÓNOMA DE NUEVO LEÓN   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOPARTICLES; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION CORRECTION; ABERRATION-CORRECTED ELECTRON MICROSCOPY; ABERRATION-CORRECTED MICROSCOPIES; MEASURING TECHNIQUE; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

SCANNING ELECTRON MICROSCOPY;

EID: 84943371009     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-3-319-15177-9_1     Document Type: Chapter

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