Determination of recombination coefficients for nanocrystalline silicon embedded in hydrogenated amorphous silicon

Optics Letters

Volumn 40, Issue 16, 2015, Pages 3889-3892

  He, Wei ^a   Zakar, Ammar ^a   Roger, Thomas ^a   Yurkevich, Igor V ^b   Kaplan, Andre ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b ASTON UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AUGERS; HYDROGENATION; IMPURITIES; IONIZATION; NANOCRYSTALLINE SILICON; NANOCRYSTALS; REFLECTION; SILICON;

AUGER IONIZATION; INITIAL CONCENTRATION; PUMP-PROBE REFLECTANCE; RATE EQUATIONS; RECOMBINATION COEFFICIENT; RECOMBINATION DYNAMICS; RECOMBINATION PROCESS;

AMORPHOUS SILICON;

EID: 84942900066     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.40.003889     Document Type: Article

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