Light-induced reflectivity transients in black-Si nanoneedles

Solar Energy Materials and Solar Cells

Volumn 144, Issue , 2016, Pages 221-227

  Scajev P ^a   Malinauskas, T ^a   Seniutinas, G ^b,c   Arnold, M D ^d   Gentle, A ^d   Aharonovich, I ^d   Gervinskas, G ^b,c   Michaux, P ^b   Hartley, J S ^b   Mayes, E L H ^e   Stoddart, P R ^b   Juodkazis, S ^b,c  

^a VILNIUS UNIVERSITY   (Lithuania)

^b SWINBURNE UNIVERSITY OF TECHNOLOGY   (Australia)

^c MELBOURNE CENTRE FOR NANOFABRICATION   (Australia)

^d UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

^e RMIT UNIVERSITY   (Australia)

Author keywords

Black silicon; Differential reflection; Nano needles; Spectroscopic ellipsometry

Indexed keywords

CHEMICAL ANALYSIS; ELLIPSOMETRY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LASER EXCITATION; NANONEEDLES; NEEDLES; OPTICAL PUMPING; PROBES; PUMPING (LASER); REFLECTION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ANALYSIS; SPECTROSCOPIC ELLIPSOMETRY; TRANSMISSION ELECTRON MICROSCOPY;

BLACK SILICON; DIFFERENTIAL REFLECTION; DIFFERENTIAL REFLECTIVITY; PICOSECOND LASER PULSE; REFRACTIVE INDEX PROFILES; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; SPECULAR REFLECTIONS; SURFACE RECOMBINATION VELOCITIES;

SILICON;

EID: 84942540318     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2015.08.030     Document Type: Article

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