Automated characterization of TAS-MRAM test arrays

Proceedings - 2015 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015

Volumn , Issue , 2015, Pages

  Grossi, Alessandro ^a   Zambelli, Cristian ^a   Olivo, Piero ^a   Pellati, Paolo ^b   Ramponi, Michele ^b   Alvarez Herault, Jeremy ^c   Mackay, Ken ^c  

^a UNIVERSITY OF FERRARA   (Italy)

^b Active Technologies Srl   (Italy)

^c Crocus Technology   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EQUIPMENT TESTING; INTEGRATED CONTROL; NANOTECHNOLOGY;

AUTOMATED TEST EQUIPMENT; MRAM ARRAYS; PERFORMANCE AND RELIABILITIES; TEST ARRAYS;

MAGNETIC RECORDING;

EID: 84942532252     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DTIS.2015.7127367     Document Type: Conference Paper

References (9)

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