SCOPUS 정보 검색 플랫폼

Journal of Materials Science: Materials in Electronics

Volumn 26, Issue 5, 2015, Pages 3155-3162

Effect of Mg doping on structural, optical and photocatalytic activity of SnO2 nanostructure thin films

(2) Vadivel, S a Rajarajan, G b

a PAAVAI ENGINEERING COLLEGE (India)

b Selvam College of Engineering and Technology (India)

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC COMPOUNDS; ATOMIC FORCE MICROSCOPY; DEPOSITION; DOPING (ADDITIVES); DYES; ENERGY GAP; MAGNESIUM; NANOCRYSTALS; OXIDE MINERALS; PHOTOCATALYSIS; PHOTOLUMINESCENCE; RAMAN SCATTERING; SURFACE ROUGHNESS; THIN FILMS; X RAY DIFFRACTION;

ATOMIC FORCE MICROGRAPHS; CHEMICAL BATH DEPOSITION TECHNIQUE; NANOCRYSTALLINE THIN FILMS; NANOSTRUCTURE THIN FILMS; OPTICAL BAND GAP ENERGY; PHOTOCATALYTIC ACTIVITIES; PHOTOLUMINESCENCE SPECTRUM; ULTRAVIOLET LIGHT IRRADIATION;

SEMICONDUCTOR DOPING;

EID: 84938975939 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-015-2811-z Document Type: Article

Times cited : (61)

References (22)

1
- 78651235595
- (ed), Springer, Berlin:
- D.S. Ginley (ed.), Handbook of transparent conductors (Springer, Berlin, 2010)
- (2010) Handbook of transparent conductors
- Ginley, D.S.¹

2
- 17744392837
- R.S. Rusu, G.I. Russia, J. Optoelectronics, Adv. Mater. 7, 823–828 (2005)
- (2005) Adv. Mater. , vol.7 , pp. 823-828
- Rusu, R.S.¹ Russia, G.I.² Optoelectronics, J.³

3
- 84894048197
- M. Parthibavarman, K. Vallalperuman, S. Sathishkumar, M. Durairaj, K. Thavamani, J. Mater. Sci.: Mater. Electron. 25, 730–735 (2014)
- (2014) J. Mater. Sci.: Mater. Electron. , vol.25 , pp. 730-735
- Parthibavarman, M.¹ Vallalperuman, K.² Sathishkumar, S.³ Durairaj, M.⁴ Thavamani, K.⁵

4
- 0024664973
- C.F. Wan, R.D. McGrath, W.F. Keenan, S. Frank, J. Electrochem. Soc. 136, 1459–1463 (1989)
- (1989) J. Electrochem. Soc. , vol.136 , pp. 1459-1463
- Wan, C.F.¹ McGrath, R.D.² Keenan, W.F.³ Frank, S.⁴

5
- 69549090015
- W. Hamd, Y.C. Wu, A. Boulle, Thin Solid Films 518, 1–5 (2009)
- (2009) Thin Solid Films , vol.518 , pp. 1-5
- Hamd, W.¹ Wu, Y.C.² Boulle, A.³

6
- 67650489073
- A.F. Khan, M. Mehmood, A.M. Rana, M.T. Bhatti, Appl. Surf. Sci. 255, 8562–8565 (2009)
- (2009) Appl. Surf. Sci. , vol.255 , pp. 8562-8565
- Khan, A.F.¹ Mehmood, M.² Rana, A.M.³ Bhatti, M.T.⁴

7
- 0034250856
- G. Korotcenkov, M. DiBattista, J. Schwank, V. Brinzari, Mater. Sci. Eng. B 77, 33–39 (2010)
- (2010) Mater. Sci. Eng., B , vol.77 , pp. 33-39
- Korotcenkov, G.¹ DiBattista, M.² Schwank, J.³ Brinzari, V.⁴

8
- 84868250469
- K.M. Abhirami, P. Matheswaran, B. Gokul, R. Sathyamoorthy, D. Kanjilal, K. Asokan, Vacuum 90, 39–43 (2013)
- (2013) Vacuum , vol.90 , pp. 39-43
- Abhirami, K.M.¹ Matheswaran, P.² Gokul, B.³ Sathyamoorthy, R.⁴ Kanjilal, D.⁵ Asokan, K.⁶

9
- 79955153731
- Y.T. Han, X. Wu, Y.L. Ma, L.H. Gong, F.Y. Qu, H.J. Fan, Cryst. Eng. Comm. 13, 3506–3510 (2011)
- (2011) Cryst. Eng. Comm. , vol.13 , pp. 3506-3510
- Han, Y.T.¹ Wu, X.² Ma, Y.L.³ Gong, L.H.⁴ Qu, F.Y.⁵ Fan, H.J.⁶

10
- 84880291578
- S.M. Ali, S.T. Hussain, S.A. Bakar, J. Muhammad, N.U. Rehman, J. Phys Conf. Ser. 439, 012013 (2013)
- (2013) J. Phys: Conf. Ser. , vol.439 , Issue.2013 , pp. 012013
- Ali, S.M.¹ Hussain, S.T.² Bakar, S.A.³ Muhammad, J.⁴ Rehman, N.U.⁵

11
- 84885658585
- M. Parthibavarman, B. Renganathan, D. Sastikumar, Curr. Appl. Phys. 13, 1537–1544 (2013)
- (2013) Curr. Appl. Phys. , vol.13 , pp. 1537-1544
- Parthibavarman, M.¹ Renganathan, B.² Sastikumar, D.³

12
- 0003643028
- Optical Society of America, Washington, DC:
- J.M. Bennett, L. Mattson, Introduction to surface roughness and scattering (Optical Society of America, Washington, DC, 1989)
- (1989) Introduction to surface roughness and scattering
- Bennett, J.M.¹ Mattson, L.²

13
- 65549157153
- A. Kubacka, G. Colon, M. Fernandez-Garcıa, Catal. Today 143, 286–292 (2009)
- (2009) Catal. Today , vol.143 , pp. 286-292
- Kubacka, A.¹ Colon, G.² Fernandez-Garcıa, M.³

14
- 77955410431
- S.S. Roy, J. Podder Gilberto, J. Optoelectron. Adv. Mater. 12, 1479–1484 (2010)
- (2010) J. Optoelectron. Adv. Mater. , vol.12 , Issue.2010 , pp. 1479-1484
- Roy, S.S.¹ Podder Gilberto, J.²

15
- 84928993996
- Kumar Sunar
- R.K. Nath, S.S. Nath, K. Sunar. J. Anal. Sci. Technol. 3, 85–94 (2012)
- (2012) J. Anal. Sci. Technol. , vol.3 , pp. 85-94
- Nath, R.K.¹ Nath, S.S.² Sunar, K.³

16
- 84890309299
- B. Prabitha, V.B. Nair, P. Justinvictor, G.P. Daniel, K. Joy, V. Ramakrishnan, D.D. Kumar, P.V. Thomos, Thin Solid Films 550, 121–127 (2014)
- (2014) Thin Solid Films , vol.550 , pp. 121-127
- Prabitha, B.¹ Nair, V.B.² Justinvictor, P.³ Daniel, G.P.⁴ Joy, K.⁵ Ramakrishnan, V.⁶ Kumar, D.D.⁷ Thomos, P.V.⁸

17
- 0344875971
- Z.R. Tian, J.A. Voigt, J. Liu, B. Mckenzie, M.J. Mcdermott, M.A. Rodriguez, H. Konishi, H.F. Xu, Nat. Mater. 2, 821–826 (2003)
- (2003) Nat. Mater. , vol.2 , pp. 821-826
- Tian, Z.R.¹ Voigt, J.A.² Liu, J.³ McKenzie, B.⁴ McDermott, M.J.⁵ Rodriguez, M.A.⁶ Konishi, H.⁷ Xu, H.F.⁸

18
- 73349134672
- W. Ping, Q. Li, X. Zou, W. Cheng, D. Zhang, C. Zhao, L. Chi, T. Xiao, J. Phys. Conf. Ser. 188, 012054 (2009)
- (2009) J. Phys: Conf. Ser. , vol.188 , pp. 012054
- Ping, W.¹ Li, Q.² Zou, X.³ Cheng, W.⁴ Zhang, D.⁵ Zhao, C.⁶ Chi, L.⁷ Xiao, T.⁸

19
- 84879411749
- S.M. Ali, J. Muhammad, S.T. Hussain, S.A. Bakar, M. Ashraf, N.-U. Rehman, J. Mater. Sci.: Mater. Electron. 24, 2432–2437 (2013)
- (2013) J. Mater. Sci.: Mater. Electron. , vol.24 , pp. 2432-2437
- Ali, S.M.¹ Muhammad, J.² Hussain, S.T.³ Bakar, S.A.⁴ Ashraf, M.⁵ Rehman, N.-U.⁶

20
- 84902531894
- K. Vijayarangamuthu, S. Rath, J. Alloy. Compd. 610, 706–712 (2014)
- (2014) J. Alloy. Compd. , vol.610 , pp. 706-712
- Vijayarangamuthu, K.¹ Rath, S.²

21
- 60349127005
- O. Lupan, L. Chow, G. Chai, H. Heinrich, S. Park, A. Schulte, Physica E 41, 533–536 (2009)
- (2009) Physica E , vol.41 , pp. 533-536
- Lupan, O.¹ Chow, L.² Chai, G.³ Heinrich, H.⁴ Park, S.⁵ Schulte, A.⁶

22
- 84862512846
- W. Wu, X. Xiao, S. Zhang, F. Ren, C. Jiang, Nanoscale. Res. Lett 6, 533 (2011)
- (2011) Nanoscale. Res. Lett , vol.6 , pp. 533
- Wu, W.¹ Xiao, X.² Zhang, S.³ Ren, F.⁴ Jiang, C.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.