Study of microstructural, optical and electrical properties of Mg dopped SnO thin films

Journal of Materials Science: Materials in Electronics

Volumn 24, Issue 7, 2013, Pages 2432-2437

  Ali, Syed Mansoor ^a,b   Muhammad, Jan ^a   Hussain, Syed Tajammul ^b   Bakar, Shahzad Abu ^b   Ashraf, Muhammad ^c   Naeem Ur Rehman, ^d  

^a THE ISLAMIA UNIVERSITY OF BAHAWALPUR   (Pakistan)

^b QUAID I AZAM UNIVERSITY   (Pakistan)

^c Optics Laboratories   (Pakistan)

^d PAKISTAN INSTITUTE OF ENGINEERING AND APPLIED SCIENCES   (Pakistan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPACT STRUCTURES; DC RESISTANCE; ELECTRON BEAM EVAPORATORS; GLASS SUBSTRATES; MICRO-STRUCTURAL; NYQUIST PLOTS; OPTICAL AND ELECTRICAL PROPERTIES; XRD ANALYSIS;

ELECTRON BEAMS; SCANNING ELECTRON MICROSCOPY; SINTERING; SUBSTRATES; THIN FILMS; TIN;

ELECTRIC PROPERTIES;

EID: 84879411749     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-013-1114-5     Document Type: Article

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