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Volumn 33, Issue 6, 2015, Pages
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Growth of SrVO3 thin films by hybrid molecular beam epitaxy
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM COMPOUNDS;
ATOMIC FORCE MICROSCOPY;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
LANTHANUM COMPOUNDS;
MOLECULAR BEAM EPITAXY;
MOLECULAR BEAMS;
MOLECULAR OXYGEN;
MORPHOLOGY;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SCANNING ELECTRON MICROSCOPY;
SURFACE MORPHOLOGY;
TANTALUM COMPOUNDS;
THIN FILMS;
VANADIUM COMPOUNDS;
ATOMICALLY FLAT SURFACE;
ATOMICALLY SMOOTH SURFACE;
CATION STOICHIOMETRY;
CRYSTALLINE STRUCTURE;
GROWTH TECHNIQUES;
METAL ORGANIC PRECURSORS;
NON-STOICHIOMETRY;
SCANNING TRANSMISSION ELECTRON MICROSCOPY;
STRONTIUM COMPOUNDS;
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EID: 84938308131
PISSN: 07342101
EISSN: 15208559
Source Type: Journal
DOI: 10.1116/1.4927439 Document Type: Article |
Times cited : (24)
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References (29)
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