The dynamics of coarsening in highly anisotropic systems: Si particles in Al-Si liquids

Acta Materialia

Volumn 97, Issue , 2015, Pages 325-337

  Shahani, A J ^a   Gulsoy, E B ^a   Roussochatzakis, V J ^a   Gibbs, J W ^a   Fife, J L ^b   Voorhees, P W ^a  

^a Northwestern University   (United States)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

4D characterization; Aluminum Silicon alloys; Anisotropic growth morphologies; Isothermal coarsening; Phase contrast X ray tomography

Indexed keywords

ALLOYS; ALUMINUM; ANISOTROPY; COARSENING; CRYSTAL STRUCTURE; IMAGING SYSTEMS; MORPHOLOGY; NORMAL DISTRIBUTION; PHASE INTERFACES; SILICON; TOMOGRAPHY;

ALUMINUM -SILICON ALLOYS; ANISOTROPIC GROWTH; ANISOTROPIC PARTICLES; INTERFACE NORMAL DISTRIBUTIONS; INTERFACE SHAPE DISTRIBUTION; INTERFACIAL VELOCITIES; SOLID-LIQUID INTERFACES; X-RAY TOMOGRAPHY;

SILICON ALLOYS;

EID: 84937570112     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2015.06.064     Document Type: Article

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