Four-dimensional morphological evolution of an aluminum silicon alloy using propagation-based phase contrast x-ray tomographic microscopy

Materials Transactions

Volumn 55, Issue 1, 2014, Pages 161-164

  Gulsoy, Emine Begum ^a   Shahani, Ashwin J ^a   Gibbs, John W ^a   Fife, Julie L ^b   Voorhees, Peter W ^b  

^a Northwestern University   (United States)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Aluminumsilicon alloy; Coarsening; Microstructural characterization; Propagation based phase contrast; X ray tomographic microscopy

Indexed keywords

ALUMINUM SILICON ALLOYS; EVOLUTION OF THE MICROSTRUCTURE; MICRO-STRUCTURAL CHARACTERIZATION; MORPHOLOGICAL EVOLUTION; PHASE CONTRASTS; PRIMARY SILICON; THREE DIMENSIONAL MORPHOLOGY; X-RAY TOMOGRAPHIC MICROSCOPIES;

ALUMINUM; COARSENING; MORPHOLOGY; SILICON ALLOYS; TOMOGRAPHY; X RAYS;

ALUMINUM ALLOYS;

EID: 84892623637     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.M2013225     Document Type: Article

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