Measuring optical anisotropy in poly(3,4-ethylene dioxythiophene):poly(styrene sulfonate) films with added graphene

Organic Electronics

Volumn 25, Issue , 2015, Pages 317-323

  Isoniemi, Tommi ^a   Tuukkanen, Sampo ^b   Cameron, David C ^c   Simonen, Janne ^a   Toppari, J Jussi ^a  

^a UNIVERSITY OF JYVÄSKYLÄ   (Finland)

^b TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

^c Innovation and Technology Center Miktech Oy   (Finland)

Author keywords

Anisotropy; Conducting polymer; Graphene; PEDOT:PSS; Spectroscopy

Indexed keywords

ANISOTROPY; CONDUCTING POLYMERS; ELLIPSOMETRY; GRAPHENE; GRAPHENE DEVICES; OPTICAL ANISOTROPY; PLASMONICS; PLASTIC COATINGS; REFRACTIVE INDEX; SPECTROSCOPY; STYRENE;

ANISOTROPIC PROPERTY; ELECTRICAL ANISOTROPY; HIGH PERFORMANCE DEVICES; PEDOT:PSS; POLY(3 ,4-ETHYLENEDIOXYTHIOPHENE); POLY(STYRENE SULFONATE); SOLUTION PROCESSABILITY; TOTAL INTERNAL REFLECTIONS;

OPTICAL FILMS;

EID: 84936759109     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2015.06.037     Document Type: Article

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