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Volumn 358, Issue 17, 2012, Pages 2520-2524

Real-time ellipsometric characterization of the initial growth stage of poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) films by electrospray deposition using N,N-dimethylformamide solvent solution

(5) Ino, Tomohisa a Hiate, Taiga a Fukuda, Takeshi a Ueno, Keiji a Shirai, Hajime a

a SAITAMA UNIVERSITY (Japan)

Author keywords

DMF; Electrospray deposition; PEDOT:PSS; Real time monitoring; Spectroscopic ellipsometry

Indexed keywords

ANISOTROPIC OPTICAL PROPERTIES; COATED GLASS; DMF; ELECTROSPRAY DEPOSITION; GROWTH STAGES; HOMOGENEOUS GROWTH; INDIUM TIN OXIDE; N ,N-DIMETHYLFORMAMIDE; PEDOT:PSS; POLY-3 ,4-ETHYLENEDIOXYTHIOPHENE; POLYMER CHAINS; PREFERENTIAL ORIENTATION; PREPARATION PROCESS; REAL TIME MONITORING;

CONDUCTING POLYMERS; DIMETHYLFORMAMIDE; FILM PREPARATION; ITO GLASS; MOLECULAR ORIENTATION; OPTICAL PROPERTIES; ORGANIC SOLVENTS; SILICON WAFERS; SPECTROSCOPIC ELLIPSOMETRY; TIN;

FILM GROWTH;

EID: 84865702464 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2012.01.055 Document Type: Conference Paper

Times cited : (8)

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