Surface determination through atomically resolved secondary-electron imaging

Nature Communications

Volumn 6, Issue , 2015, Pages

  Ciston, J ^a   Brown, H G ^b   D'Alfonso, A J ^b   Koirala, P ^c   Ophus, C ^a   Lin, Y ^c   Suzuki, Y ^d   Inada, H ^d   Zhu, Y ^e   Allen, L J ^b   Marks, L D ^c  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF MELBOURNE   (Australia)

^c Northwestern University   (United States)

^d HITACHI HIGH TECHNOLOGIES CORPORATION   (Japan)

^e BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

STRONTIUM;

CRYSTAL STRUCTURE; IMAGING METHOD; SIMULATION; STRONTIUM;

ARTICLE; ATOMIC RESOLUTION SECONDARY ELECTRON MICROSCOPY; CHEMICAL STRUCTURE; DENSITY FUNCTIONAL THEORY; DIELECTRIC CONSTANT; ELECTRON MICROSCOPY; MATHEMATICAL ANALYSIS; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 84935895473     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms8358     Document Type: Article

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