Process impact on SRAM alpha-particle SEU performance

IEEE International Reliability Physics Symposium Proceedings

Volumn 2004-January, Issue January, 2004, Pages 294-299

  Xu, Y Z ^a   Puchner, H ^a   Chatila, A ^a   Pohland, O ^a   Bruggeman, B ^a   Jin, B ^a   Radaelli, D ^a   Daniel, S ^a  

^a CYPRESS SEMICONDUCTOR   (United States)

Author keywords

A particle; SER; SRAM

Indexed keywords

CAPACITANCE; CAPACITORS; RADIATION HARDENING; THRESHOLD VOLTAGE;

A-PARTICLES; EPITAXIAL SUBSTRATES; JUNCTION CAPACITANCES; SECONDARY IMPACTS; SER; SINGLE EVENT UPSETS; SOURCE/DRAIN JUNCTIONS; TRANSISTOR DRIVE CURRENTS;

STATIC RANDOM ACCESS STORAGE;

EID: 84932090997     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2004.1315340     Document Type: Conference Paper

References (11)

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