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Volumn 7, Issue 4, 2015, Pages 1280-1284

Breakdown of metallic single-wall carbon nanotube paths by NiO nanoparticle point etching for high performance thin film transistors

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; CARBON NANOTUBES; ETCHING; FIELD EFFECT TRANSISTORS; NANOPARTICLES; THIN FILM TRANSISTORS; YARN;

EID: 84931037399     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c4nr06057a     Document Type: Article
Times cited : (3)

References (26)
  • 13
    • 58049214027 scopus 로고    scopus 로고
    • R. Martel ACS Nano 2008 2 2195 2199
    • (2008) ACS Nano , vol.2 , pp. 2195-2199
    • Martel, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.