SCOPUS 정보 검색 플랫폼

Review of Scientific Instruments

Volumn 86, Issue 5, 2015, Pages

Development of micro-four-point probe in a scanning tunneling microscope for in situ electrical transport measurement

(6) Ge, Jian Feng a Liu, Zhi Long a Gao, Chun Lei a Qian, Dong a Liu, Canhua a Jia, Jin Feng a

a SHANGHAI JIAO TONG UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; PROBES; SCANNING TUNNELING MICROSCOPY;

CRYSTAL SURFACES; ELECTRICAL TRANSPORT MEASUREMENTS; ELECTRICAL TRANSPORT PROPERTIES; I-V CHARACTERISTIC CURVE; MICRO-FOUR-POINT PROBES; MULTI-FUNCTIONAL; TRANSPORT MEASUREMENTS; TUNNELING SPECTRA;

MICROSCOPES;

EID: 84929179475 PISSN: 00346748 EISSN: 10897623 Source Type: Journal
DOI: 10.1063/1.4919766 Document Type: Article

Times cited : (20)

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