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Volumn 11, Issue 17, 2015, Pages 3332-3339
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Hierarchical line-defect patterns in wrinkled surfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DEFECT DENSITY;
ELASTIC MODULI;
ELASTICITY;
MICROCHANNELS;
SKIN;
SUBSTRATES;
CROSS-LINKING DENSITY;
ELASTOMERIC SUBSTRATES;
HIERARCHICAL STRUCTURES;
INDENTATION MEASUREMENTS;
MECHANICAL PARAMETERS;
POLYDIMETHYLSILOXANE PDMS;
SWIFT-HOHENBERG EQUATIONS;
WRINKLING PATTERNS;
DEFECTS;
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EID: 84928570034
PISSN: 1744683X
EISSN: 17446848
Source Type: Journal
DOI: 10.1039/c5sm00318k Document Type: Article |
Times cited : (49)
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References (49)
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