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Volumn 11, Issue 17, 2015, Pages 3332-3339

Hierarchical line-defect patterns in wrinkled surfaces

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFECT DENSITY; ELASTIC MODULI; ELASTICITY; MICROCHANNELS; SKIN; SUBSTRATES;

EID: 84928570034     PISSN: 1744683X     EISSN: 17446848     Source Type: Journal    
DOI: 10.1039/c5sm00318k     Document Type: Article
Times cited : (49)

References (49)
  • 34
    • 77949566796 scopus 로고    scopus 로고
    • Oxford University Press, Oxford
    • P. Ball, Branches, Oxford University Press, Oxford, 2009
    • (2009) Branches
    • Ball, P.1
  • 40
    • 84928521623 scopus 로고    scopus 로고
    • B. Foster Am. Lab. 2012 42 215 221
    • (2012) Am. Lab. , vol.42 , pp. 215-221
    • Foster, B.1
  • 49
    • 84928543918 scopus 로고    scopus 로고
    • B. Kaoui, A. Guckenberger, F. Ziebert, A. Krekhov and W. Zimmermann, 2015, ArXiv: 1503.04234
    • B. Kaoui, A. Guckenberger, F. Ziebert, A. Krekhov and W. Zimmermann, 2015, ArXiv: 1503.04234


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.