SCOPUS 정보 검색 플랫폼

Soft Matter

Volumn 6, Issue 22, 2010, Pages 5789-5794

Contact-line mechanics for pattern control

(4) Miquelard Garnier, Guillaume a Croll, Andrew B a Davis, Chelsea S a Crosby, Alfred J a

a UNIVERSITY OF MASSACHUSETTS (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE INTERFACES; COMPRESSIVE STRAIN; CONTACT LINES; CRITICAL VELOCITIES; EXISTING METHOD; LENGTH SCALE; LOCAL DEFORMATIONS; LOCAL PATTERNS; METROLOGY INSTRUMENTS; NEW PROCESS; PATTERN CONTROL; SOFT SUBSTRATES; SURFACE PATTERN; THIN POLYMER FILMS; VELOCITY DEPENDENCE; WIDE-RANGING APPLICATIONS;

POLYMER FILMS;

STRAIN;

EID: 78149255399 PISSN: 1744683X EISSN: 17446848 Source Type: Journal
DOI: 10.1039/c0sm00165a Document Type: Article

Times cited : (43)

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