Nitrogen dioxide sensing properties of sprayed tungsten oxide thin film sensor: Effect of film thickness

Journal of Colloid and Interface Science

Volumn 451, Issue , 2015, Pages 245-254

  Ganbavle, V V ^a   Mohite, S V ^a   Agawane, G L ^b   Kim, J H ^b   Rajpure, K Y ^a  

^a SHIVAJI UNIVERSITY   (India)

^b Chonnam National University   (South Korea)

Author keywords

NO2< inf> sensor; Photoluminescence; Selectivity; Spray pyrolysis; WO3< inf>; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; CATALYST SELECTIVITY; CHEMICAL SENSORS; FILM THICKNESS; NITROGEN OXIDES; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SPRAY PYROLYSIS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

GLASS SUBSTRATES; LOWER DETECTION LIMIT; NITROGEN DIOXIDES; OPERATING TEMPERATURE; OPTIMAL SENSOR; SENSING PROPERTY; SPRAY-PYROLYSIS TECHNIQUES; TUNGSTEN OXIDE THIN FILMS;

X RAY PHOTOELECTRON SPECTROSCOPY;

AMMONIA; CARBON MONOXIDE; HYDROGEN SULFIDE; LIQUEFIED PETROLEUM GAS; NITROGEN DIOXIDE; SULFUR DIOXIDE; TUNGSTEN DERIVATIVE; TUNGSTEN OXIDE; UNCLASSIFIED DRUG;

ABSORPTION; ADSORPTION; ARTICLE; ATOMIC FORCE MICROSCOPY; DECOMPOSITION; ELECTRIC RESISTANCE; FILM THICKNESS; GAS SENSOR; LIMIT OF DETECTION; PHOTOLUMINESCENCE; PHYSICAL PARAMETERS; PRIORITY JOURNAL; PYROLYSIS; REPRODUCIBILITY; SCANNING ELECTRON MICROSCOPY; SENSOR; STOICHIOMETRY; TEMPERATURE; THICKNESS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84927947326     PISSN: 00219797     EISSN: 10957103     Source Type: Journal    
DOI: 10.1016/j.jcis.2015.04.001     Document Type: Article

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