NiO hierarchical nanorings on SiC: Enhancing relaxation to tune microwave absorption at elevated temperature

ACS Applied Materials and Interfaces

Volumn 7, Issue 13, 2015, Pages 7073-7077

  Yang, Hui Jing ^a,b   Cao, Wen Qiang ^c   Zhang, De Qing ^a   Su, Tie Jian ^a   Shi, Hong Long ^c   Wang, Wen Zhong ^c   Yuan, Jie ^c   Cao, Mao Sheng ^a  

^a BEIJING INSTITUTE OF TECHNOLOGY   (China)

^b TANGSHAN NORMAL UNIVERSITY   (China)

^c MINZU UNIVERSITY OF CHINA   (China)

Author keywords

Dielectric properties; Hierarchical architecture; Microwave absorption; Multirelaxation; NiO nanorings

Indexed keywords

ARCHITECTURE; DIELECTRIC PROPERTIES; MICROWAVES; NANORINGS; NANOSTRUCTURED MATERIALS; NICKEL OXIDE; SILICON CARBIDE;

ELEVATED TEMPERATURE; HIERARCHICAL ARCHITECTURES; IMAGINARY PARTS; INCREASING TEMPERATURES; MICROWAVE ABSORPTION; MULTIRELAXATION; REFLECTION LOSS; SYNERGISTIC EFFECT;

SILICON COMPOUNDS;

EID: 84926680712     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/acsami.5b01122     Document Type: Article

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